Scanning Electron Microscope (SEM)
X-ray Photoelectron Spectroscopy (XPS)
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Auger Electron Spectroscopy (AES)
Field Emission Transmission Electron Microscope (FETEM)
3D Optical Microscope
Atomic Force Microscope (AFM)
Met Microscope