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Surface topography analysis
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Atomic Force Microscope (AFM)

Equipment model：Dimension ICON
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Technical Parameters

  1. Scanning Range: 90µm × 90µm × 10µm

  2. Optical Assistance Observation System: 285 ~ 1285x Magnification

  3. Resolution: 1.5µm

  4. Field of View: 180-1465µm


Application Range

Surface topography imaging, surface roughness, 3D surface morphology imaging, quantitative measurement of morphology.
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Friendly link： Institute of Physics, Chinese Academy of Sciences (IOP, CAS) Yangtze River Delta Physics Research Center Co., Ltd. Liyang Deepwater Sci. Tech. Consulting Ltd. Company

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