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Surface topography analysis
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Field Emission Transmission Electron Microscope (FETEM)

Equipment model：FEI Tecnai F20
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Technical Parameters

Maximum Accelerating Voltage: 200 kV

Schottky Thermal Field Emission Electron Gun

Lattice Resolution: 0.10 nm, Point Resolution: 0.24 nm

Information Resolution: 0.16 nm, STEM Resolution: 0.2 nm

Minimum Beam Spot Size: ≤0.3nm

TEM Magnification: 25×-1000k×, Maximum Tilting Angle: ≥40°, ≥25°

X-ray Energy Dispersive Spectroscopy (EDS) Resolution: 150eV, Resolution Range: Be-U


Application Range

Observation of the microstructures of various materials and microanalysis of samples at the nanoscale, including: morphology observation, High-Resolution Transmission Electron Microscopy (HRTEM), Electron Diffraction (ED), Convergent Beam Electron Diffraction (CBED), Diffraction Contrast Imaging (BF, DF), X-ray Energy Dispersive Spectroscopy (EDS), Atomic Number Z-Contrast Imaging (HAADF - STEM), etc.

Applicable to any inorganic materials excluding magnetic materials, including powders, films, and bulk materials; not suitable for organic and biological materials.
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Detail
Friendly link： Institute of Physics, Chinese Academy of Sciences (IOP, CAS) Yangtze River Delta Physics Research Center Co., Ltd. Liyang Deepwater Sci. Tech. Consulting Ltd. Company

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