Field-launched Transmission Electron Microscope
FEI Tecnai F20ST
FEI Corporation, USA
Key specifications and technical indicators:
The maximum acceleration voltage is 200 kV.
The Schottky hot field fires an electronic gun.
The lattice resolution is 0.10 nm and the point resolution is 0.24 nm.
Information resolution 0.16 nm and STEM resolution 0.2 nm.
The minimum beam size is ≤ 3nm.
Tem magnification of 25 x-1000k x, maximum inclination angle of α≥±40°，β≥±25°。
X-ray energy resolution 150eV resolution range Be-U.
X-ray spectrometer of EDAX, USA; STEM-HAADF accessories.
Key features and applications:
Observe the microstructure of various materials and perform nanoscale micro-region analysis of samples, such as: morphological observation, high-resolution electron microscopy (HRTEM), electron diffraction (ED), cluster electron diffraction (CBED), diffraction lining imaging (BF, DF), X-ray energy spectrometry (EDS), Atomic number Z-lining imaging (HAADF - STEM) and so on.
Comprehensive analysis ability.
Any inorganic material other than magnetic materials, including powders, films and blocks;
Semiconductor TEM Pictures
A quasi-crystal HRTEM image of Al-Pd-Mn twenty-faced bodies
Pt/Au Catalyst Particle STEM-EDS Spectrometry