Technical Parameters
Laser Wavelength 1: 532nm, Grating Type: 1800 gr/mm, Spectral Range: 50-9000 cm-1;
Laser Wavelength 2: 785nm, Grating Type: 1200 gr/mm, Spectral Range: 50-3200 cm-1;
Automatic XYZ Stage, Minimum Step Size: 0.1μm, Repeatability Accuracy: ≤0.1μm;
High Sensitivity: Signal-to-Noise Ratio of Silicon's Third-Order Raman Peak ≥25:1, Fourth-Order Peak Visible;
High Repeatability: ≤ ±0.02cm-1;
Total Optical Efficiency of the System: ≥30%; High Stability: Original German Research-Grade Leica Microscope (Equipped with High-Resolution Color Camera);
Objectives: 5X, 20X, 100X objectives, and 50X long-working-distance objective;
Detector: Standard CCD Detector (1024 x 256 pixels),
Semiconductor cooled to –70 ºC, no need for water or liquid nitrogen cooling.
XYZ High-Precision Mechanical Automatic Stage: Scanning Range X ≥ 100 mm; Y ≥ 70 mm, Accuracy ≤ 100 nm;
Automatic Focusing, Focus Position Correction during Testing, Suitable for Samples with Irregular Surfaces, 3D Raman Scanning Imaging
The instrument is equipped with an electrochemical reaction cell.
Application Range
Applicable in various fields such as energy storage, semiconductor materials, carbon materials, chemistry, physics, biology, medicine, environment, archaeology, etc.
Pure qualitative analysis, quantitative analysis, and determination of molecular structures.
Detail
Detail
