Tianmu Lake Institute of Advanced Energy Storage Technologies Co., Ltd.2019                                                               Powwed by:www.300.cn Changzhou  苏ICP备14056531号-1号

Atomic Force Microscope

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Atomic Force Microscope

(AFM)
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Description

 

Instrument introduction:

AFM is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of materials by detecting the extremely weak interatomic interaction force between the surface of the sample and a miniature force-sensitive element.
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暂未实现,敬请期待
暂未实现,敬请期待
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