Tianmu Lake Institute of Advanced Energy Storage Technologies Co., Ltd.2019 Powwed by:www.300.cn Changzhou 苏ICP备14056531号-1号
Atomic Force Microscope
Page view:
Description
Instrument introduction:
AFM is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of materials by detecting the extremely weak interatomic interaction force between the surface of the sample and a miniature force-sensitive element.
Previous article
Synchronous Thermal Analyzer
无
Next article